Widianto, Masaki Hashizume, Shohei Suenaga, Hiroyuki Yotsuyanagi, Akira Ono, Shyue-Kung Lu, Zvi Roth. A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs. IEICE Transactions, 99-D(11):2723-2733, 2016. [doi]
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