Test-Access Solutions for Three-Dimensional SOCs - researchr publication authors

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Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yuan Xie. Test-Access Solutions for Three-Dimensional SOCs. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1, IEEE, 2008. [doi]

This author has not been identified. Look up 'Xiaoxia Wu' in GoogleThis author has not been identified. Look up 'Yibo Chen' in GoogleThis author has not been identified. Look up 'Krishnendu Chakrabarty' in GoogleThis author has not been identified. Look up 'Yuan Xie' in Google

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