Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yuan Xie. Test-Access Solutions for Three-Dimensional SOCs. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1, IEEE, 2008. [doi]
Abstract is missing.