Xiaoxia Wu, Yibo Chen, Krishnendu Chakrabarty, Yuan Xie. Test-Access Solutions for Three-Dimensional SOCs. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1, IEEE, 2008. [doi]
@inproceedings{WuCCX08-0, title = {Test-Access Solutions for Three-Dimensional SOCs}, author = {Xiaoxia Wu and Yibo Chen and Krishnendu Chakrabarty and Yuan Xie}, year = {2008}, doi = {10.1109/TEST.2008.4700684}, url = {http://dx.doi.org/10.1109/TEST.2008.4700684}, researchr = {https://researchr.org/publication/WuCCX08-0}, cites = {0}, citedby = {0}, pages = {1}, booktitle = {2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008}, editor = {Douglas Young and Nur A. Touba}, publisher = {IEEE}, isbn = {978-1-4244-2403-0}, }