Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang. An Efficient Peak Power Reduction Technique for Scan Testing. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 111-114, IEEE, 2007. [doi]
@inproceedings{WuHH07-0,
title = {An Efficient Peak Power Reduction Technique for Scan Testing},
author = {Meng-Fan Wu and Kai-Shun Hu and Jiun-Lang Huang},
year = {2007},
doi = {10.1109/ATS.2007.54},
url = {https://doi.org/10.1109/ATS.2007.54},
researchr = {https://researchr.org/publication/WuHH07-0},
cites = {0},
citedby = {0},
pages = {111-114},
booktitle = {16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007},
publisher = {IEEE},
isbn = {978-0-7695-2890-8},
}