An Efficient Peak Power Reduction Technique for Scan Testing

Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang. An Efficient Peak Power Reduction Technique for Scan Testing. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 111-114, IEEE, 2007. [doi]

Abstract

Abstract is missing.