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Meng-Fan Wu, Kai-Shun Hu, Jiun-Lang Huang. An Efficient Peak Power Reduction Technique for Scan Testing. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 111-114, IEEE, 2007. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Peak-power reduction for multiple-scan circuits during test applicationKuen-Jong Lee, Tsung-Chu Huang, Jih-Jeen Chen. ats 2000: 453-458 [doi] A routability constrained scan chain ordering technique for test power reductionX.-L. Huang, J.-L. Huang. aspdac 2006: 648-652 [doi] An Input Control Technique for Power Reduction in Scan Circuits During Test ApplicationTsung-Chu Huang, Kuen-Jong Lee. ats 1999: 315-320 [doi] An Interleaving Technique for Reducing Peak Power in Multiple-Chain Scan Circuits During Test ApplicationKuen-Jong Lee, Tsung-Chu Huang. et, 18(6):627-636, 2002. [doi]
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