Po-Hsun Wu, Mark Po-Hung Lin, Xin Li, Tsung-Yi Ho. Common-Centroid FinFET Placement Considering the Impact of Gate Misalignment. In Azadeh Davoodi, Evangeline Young, editors, Proceedings of the 2015 Symposium on International Symposium on Physical Design, ISPD 2015, Monterey, CA, USA, March 29 - April 01, 2015. pages 25-31, ACM, 2015. [doi]
Abstract is missing.