Ernest Y. Wu, Baozhen Li, James H. Stathis, Andrew Kim. Comprehensive Methodology for Multiple Spots Competing Progressive Breakdown for BEOL/FEOL Applications. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-8, IEEE, 2019. [doi]
@inproceedings{WuLSK19, title = {Comprehensive Methodology for Multiple Spots Competing Progressive Breakdown for BEOL/FEOL Applications}, author = {Ernest Y. Wu and Baozhen Li and James H. Stathis and Andrew Kim}, year = {2019}, doi = {10.1109/IRPS.2019.8720425}, url = {https://doi.org/10.1109/IRPS.2019.8720425}, researchr = {https://researchr.org/publication/WuLSK19}, cites = {0}, citedby = {0}, pages = {1-8}, booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019}, publisher = {IEEE}, isbn = {978-1-5386-9504-3}, }