Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
David M. Wu, Charles E. Radke. Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. In DAC. pages 291-295, 1991. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: An optimized delay testing technique for LSSD-based VLSI logic circuitsDavid M. Wu. vts 1991: 239-248 [doi] Lazy symbolic execution for test data generationMengxiang Lin, Yin-li Chen, Kai Yu, Guo-shi Wu. iee, 5(2):132-141, 2011. [doi]
The following publications are possibly variants of this publication: