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MapReduce-based pattern classification for design space analysis

Yan-Shiun Wu, Hong-Yan Su, Yi-Hsiang Chang, Rasit Onur Topaloglu, Yih-Lang Li. MapReduce-based pattern classification for design space analysis. In 2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), Hsinchu, Taiwan, April 16-19, 2018. pages 1-4, IEEE, 2018. [doi]

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