A scalable quantitative measure of IR-drop effects for scan pattern generation

Meng-Fan Wu, Kun-Han Tsai, Wu-Tung Cheng, Hsin-Cheih Pan, Jiun-Lang Huang, Augusli Kifli. A scalable quantitative measure of IR-drop effects for scan pattern generation. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 162-167, IEEE, 2010. [doi]

Authors

Meng-Fan Wu

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Kun-Han Tsai

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Wu-Tung Cheng

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Hsin-Cheih Pan

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Jiun-Lang Huang

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Augusli Kifli

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