Meng-Fan Wu, Kun-Han Tsai, Wu-Tung Cheng, Hsin-Cheih Pan, Jiun-Lang Huang, Augusli Kifli. A scalable quantitative measure of IR-drop effects for scan pattern generation. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 162-167, IEEE, 2010. [doi]
@inproceedings{WuTCPHK10,
title = {A scalable quantitative measure of IR-drop effects for scan pattern generation},
author = {Meng-Fan Wu and Kun-Han Tsai and Wu-Tung Cheng and Hsin-Cheih Pan and Jiun-Lang Huang and Augusli Kifli},
year = {2010},
doi = {10.1109/ICCAD.2010.5654130},
url = {http://dx.doi.org/10.1109/ICCAD.2010.5654130},
researchr = {https://researchr.org/publication/WuTCPHK10},
cites = {0},
citedby = {0},
pages = {162-167},
booktitle = {2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA},
publisher = {IEEE},
}