A scalable quantitative measure of IR-drop effects for scan pattern generation

Meng-Fan Wu, Kun-Han Tsai, Wu-Tung Cheng, Hsin-Cheih Pan, Jiun-Lang Huang, Augusli Kifli. A scalable quantitative measure of IR-drop effects for scan pattern generation. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 162-167, IEEE, 2010. [doi]

Abstract

Abstract is missing.