Shianling Wu, Laung-Terng Wang, Jin Woo Cho, Zhigang Jiang, Boryau Sheu. Test compression and logic BIST at your fingertips. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 2, IEEE, 2005. [doi]
@inproceedings{WuWCJS05,
title = {Test compression and logic BIST at your fingertips},
author = {Shianling Wu and Laung-Terng Wang and Jin Woo Cho and Zhigang Jiang and Boryau Sheu},
year = {2005},
doi = {10.1109/TEST.2005.1584111},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584111},
researchr = {https://researchr.org/publication/WuWCJS05},
cites = {0},
citedby = {0},
pages = {2},
booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
publisher = {IEEE},
isbn = {0-7803-9038-5},
}