Rui Wu, Yuyang Wang, Zeyu Zhang, Chong Zhang, Clint L. Schow, John E. Bowers, Kwang-Ting Cheng. Compact modeling and circuit-level simulation of silicon nanophotonic interconnects. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 602-605, IEEE, 2017. [doi]
@inproceedings{WuWZZSBC17,
title = {Compact modeling and circuit-level simulation of silicon nanophotonic interconnects},
author = {Rui Wu and Yuyang Wang and Zeyu Zhang and Chong Zhang and Clint L. Schow and John E. Bowers and Kwang-Ting Cheng},
year = {2017},
doi = {10.23919/DATE.2017.7927057},
url = {https://doi.org/10.23919/DATE.2017.7927057},
researchr = {https://researchr.org/publication/WuWZZSBC17},
cites = {0},
citedby = {0},
pages = {602-605},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017},
editor = {David Atienza and Giorgio Di Natale},
publisher = {IEEE},
isbn = {978-3-9815370-8-6},
}