Rui Wu, Yuyang Wang, Zeyu Zhang, Chong Zhang, Clint L. Schow, John E. Bowers, Kwang-Ting Cheng. Compact modeling and circuit-level simulation of silicon nanophotonic interconnects. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 602-605, IEEE, 2017. [doi]
Abstract is missing.