Non-Scan Design for Testability Based on Fault Oriented Conflict Analysis

Dong Xiang, Shan Gu, Hideo Fujiwara. Non-Scan Design for Testability Based on Fault Oriented Conflict Analysis. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 86, IEEE Computer Society, 2002. [doi]

Authors

Dong Xiang

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Shan Gu

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Hideo Fujiwara

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