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Dong Xiang, Shan Gu, Hideo Fujiwara. Non-Scan Design for Testability Based on Fault Oriented Conflict Analysis. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 86, IEEE Computer Society, 2002. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Non-scan design for testability for synchronous sequential circuits based on conflict analysisDong Xiang, Yi Xu, Hideo Fujiwara. itc 2000: 520-529 Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict AnalysisDong Xiang, Shan Gu, Hideo Fujiwara. ats 2003: 300-305 [doi]
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