Dong Xiang, Shan Gu, Hideo Fujiwara. Non-Scan Design for Testability Based on Fault Oriented Conflict Analysis. In 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA. pages 86, IEEE Computer Society, 2002. [doi]
@inproceedings{XiangGF02,
title = {Non-Scan Design for Testability Based on Fault Oriented Conflict Analysis},
author = {Dong Xiang and Shan Gu and Hideo Fujiwara},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/ats/2002/1825/00/18250086abs.htm},
tags = {rule-based, testing, analysis, design},
researchr = {https://researchr.org/publication/XiangGF02},
cites = {0},
citedby = {0},
pages = {86},
booktitle = {11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1825-7},
}