Xiaodong Xie, Alexander Albicki, Andrzej Krasniewski. Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by Boolean Space Expansion. In Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 92, Cambridge, MA, USA, October 11-14, 1992. pages 482-485, IEEE Computer Society, 1992.
@inproceedings{XieAK92,
title = {Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by Boolean Space Expansion},
author = {Xiaodong Xie and Alexander Albicki and Andrzej Krasniewski},
year = {1992},
tags = {testing, design},
researchr = {https://researchr.org/publication/XieAK92},
cites = {0},
citedby = {0},
pages = {482-485},
booktitle = {Proceedings 1991 IEEE International Conference on Computer Design: VLSI in Computer & Processors, ICCD 92, Cambridge, MA, USA, October 11-14, 1992},
publisher = {IEEE Computer Society},
isbn = {0-8186-3110-4},
}