A Critical Scenario Filter to Accelerate Testing for Automated Vehicles

Tian Xu, Xuerun Yan, Zhen Zhang, Jia Hu, Jintao Lai. A Critical Scenario Filter to Accelerate Testing for Automated Vehicles. In 25th IEEE International Conference on Intelligent Transportation Systems, ITSC 2022, Macau, China, October 8-12, 2022. pages 3058-3060, IEEE, 2023. [doi]

Authors

Tian Xu

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Xuerun Yan

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Zhen Zhang

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Jia Hu

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Jintao Lai

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