Tian Xu, Xuerun Yan, Zhen Zhang, Jia Hu, Jintao Lai. A Critical Scenario Filter to Accelerate Testing for Automated Vehicles. In 25th IEEE International Conference on Intelligent Transportation Systems, ITSC 2022, Macau, China, October 8-12, 2022. pages 3058-3060, IEEE, 2023. [doi]
Abstract is missing.