Tian Xu, Xuerun Yan, Zhen Zhang, Jia Hu, Jintao Lai. A Critical Scenario Filter to Accelerate Testing for Automated Vehicles. In 25th IEEE International Conference on Intelligent Transportation Systems, ITSC 2022, Macau, China, October 8-12, 2022. pages 3058-3060, IEEE, 2023. [doi]
@inproceedings{XuYZHL23,
title = {A Critical Scenario Filter to Accelerate Testing for Automated Vehicles},
author = {Tian Xu and Xuerun Yan and Zhen Zhang and Jia Hu and Jintao Lai},
year = {2023},
doi = {10.1109/ITSC57777.2023.10422068},
url = {https://doi.org/10.1109/ITSC57777.2023.10422068},
researchr = {https://researchr.org/publication/XuYZHL23},
cites = {0},
citedby = {0},
pages = {3058-3060},
booktitle = {25th IEEE International Conference on Intelligent Transportation Systems, ITSC 2022, Macau, China, October 8-12, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6880-0},
}