Makoto Yabuuchi, Yasumasa Tsukamoto, Hidehiro Fujiwara, Miki Tanaka, Shinji Shinji, Koji Nii. A 28-nm 1R1W Two-Port 8T SRAM Macro With Screening Circuitry Against Read Disturbance and Wordline Coupling Noise Failures. IEEE Trans. VLSI Syst., 26(11):2335-2344, 2018. [doi]
@article{YabuuchiTFTSN18,
title = {A 28-nm 1R1W Two-Port 8T SRAM Macro With Screening Circuitry Against Read Disturbance and Wordline Coupling Noise Failures},
author = {Makoto Yabuuchi and Yasumasa Tsukamoto and Hidehiro Fujiwara and Miki Tanaka and Shinji Shinji and Koji Nii},
year = {2018},
doi = {10.1109/TVLSI.2018.2864267},
url = {http://doi.ieeecomputersociety.org/10.1109/TVLSI.2018.2864267},
researchr = {https://researchr.org/publication/YabuuchiTFTSN18},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {26},
number = {11},
pages = {2335-2344},
}