Takahiro J. Yamaguchi, James S. Tandon, Satoshi Komatsu, Kunihiro Asada. A Novel Circuit for Transition-Edge Detection: Using a Stochastic Comparator Group to Test Transition-Edge. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 168-173, IEEE Computer Society, 2014. [doi]
Abstract is missing.