Aibin Yan, Yang Chang, Jing Xiang, Hao Luo, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen. Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications. In Himanshu Thapliyal, Ronald F. DeMara, Inna Partin-Vaisband, Srinivas Katkoori, editors, Proceedings of the Great Lakes Symposium on VLSI 2023, GLSVLSI 2023, Knoxville, TN, USA, June 5-7, 2023. pages 293-298, ACM, 2023. [doi]
@inproceedings{YanCXLCHNW23,
title = {Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications},
author = {Aibin Yan and Yang Chang and Jing Xiang and Hao Luo and Jie Cui and Zhengfeng Huang and Tianming Ni and Xiaoqing Wen},
year = {2023},
doi = {10.1145/3583781.3590261},
url = {https://doi.org/10.1145/3583781.3590261},
researchr = {https://researchr.org/publication/YanCXLCHNW23},
cites = {0},
citedby = {0},
pages = {293-298},
booktitle = {Proceedings of the Great Lakes Symposium on VLSI 2023, GLSVLSI 2023, Knoxville, TN, USA, June 5-7, 2023},
editor = {Himanshu Thapliyal and Ronald F. DeMara and Inna Partin-Vaisband and Srinivas Katkoori},
publisher = {ACM},
}