A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets

Aibin Yan, Yan Chen, Jun Zhou 0016, Jie Cui 0004, Tianming Ni, Xiaoqing Wen, Patrick Girard 0001. A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-5, IEEE, 2020. [doi]

Authors

Aibin Yan

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Yan Chen

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Jun Zhou 0016

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Jie Cui 0004

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Tianming Ni

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Xiaoqing Wen

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Patrick Girard 0001

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