Aibin Yan, Yan Chen, Jun Zhou 0016, Jie Cui 0004, Tianming Ni, Xiaoqing Wen, Patrick Girard 0001. A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.