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Haihua Yan, Adit D. Singh. Reduce Yield Loss in Delay Defect Detection in Slack Interval. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 372-377, IEEE Computer Society, 2004. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI)Haihua Yan, Adit D. Singh. tvlsi, 14(11):1216-1226, 2006. [doi] Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation StudyHaihua Yan, Adit D. Singh. itc 2003: 242-251 [doi]
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