Aibin Yan, Zhelong Xu, Jie Cui 0004, Zuobin Ying, Zhengfeng Huang, Huaguo Liang, Patrick Girard 0001, Xiaoqing Wen. Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.