Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui 0004, Patrick Girard 0001, Xiaoqing Wen. Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. In IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.