Aibin Yan, Fan Xia, Tianming Ni, Jie Cui 0004, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen. A Low Overhead and Double-Node-Upset Self-Recoverable Latch. In IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023. pages 1-5, IEEE, 2023. [doi]
@inproceedings{YanXNCHGW23,
title = {A Low Overhead and Double-Node-Upset Self-Recoverable Latch},
author = {Aibin Yan and Fan Xia and Tianming Ni and Jie Cui 0004 and Zhengfeng Huang and Patrick Girard 0001 and Xiaoqing Wen},
year = {2023},
doi = {10.1109/ITC-Asia58802.2023.10301166},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301166},
researchr = {https://researchr.org/publication/YanXNCHGW23},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023},
publisher = {IEEE},
isbn = {979-8-3503-1281-2},
}