Aibin Yan, Fan Xia, Tianming Ni, Jie Cui 0004, Zhengfeng Huang, Patrick Girard 0001, Xiaoqing Wen. A Low Overhead and Double-Node-Upset Self-Recoverable Latch. In IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.