Jae-Seok Yang, Krit Athikulwongse, Young-Joon Lee, Sung Kyu Lim, David Z. Pan. TSV stress aware timing analysis with applications to 3D-IC layout optimization. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 803-806, ACM, 2010. [doi]
@inproceedings{YangALLP10,
title = {TSV stress aware timing analysis with applications to 3D-IC layout optimization},
author = {Jae-Seok Yang and Krit Athikulwongse and Young-Joon Lee and Sung Kyu Lim and David Z. Pan},
year = {2010},
doi = {10.1145/1837274.1837476},
url = {http://doi.acm.org/10.1145/1837274.1837476},
tags = {optimization, layout, analysis, context-aware},
researchr = {https://researchr.org/publication/YangALLP10},
cites = {0},
citedby = {0},
pages = {803-806},
booktitle = {Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010},
editor = {Sachin S. Sapatnekar},
publisher = {ACM},
isbn = {978-1-4503-0002-5},
}