An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing - researchr publication authors

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Chen-Yuan Yang, Xuan-Lun Huang, Jiun-Lang Huang. An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 367-372, IEEE Computer Society, 2009. [doi]

This author has not been identified. Look up 'Chen-Yuan Yang' in GoogleThis author has not been identified. Look up 'Xuan-Lun Huang' in GoogleThis author has not been identified. Look up 'Jiun-Lang Huang' in Google

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