Chen-Yuan Yang, Xuan-Lun Huang, Jiun-Lang Huang. An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 367-372, IEEE Computer Society, 2009. [doi]
@inproceedings{YangHH09-0,
title = {An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing},
author = {Chen-Yuan Yang and Xuan-Lun Huang and Jiun-Lang Huang},
year = {2009},
doi = {10.1109/ATS.2009.55},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.55},
tags = {testing},
researchr = {https://researchr.org/publication/YangHH09-0},
cites = {0},
citedby = {0},
pages = {367-372},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3864-8},
}