Chen-Yuan Yang, Xuan-Lun Huang, Jiun-Lang Huang. An On-Chip Integrator Leakage Characterization Technique and Its Application to Switched Capacitor Circuits Testing. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 367-372, IEEE Computer Society, 2009. [doi]
Abstract is missing.