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Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach

Jianlei Yang, Peiyuan Wang, Yaojun Zhang, Yuanqing Cheng, Weisheng Zhao, Yiran Chen, Hai Helen Li. Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(3):380-393, 2016. [doi]

Authors

Jianlei Yang

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Peiyuan Wang

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Yaojun Zhang

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Yuanqing Cheng

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Weisheng Zhao

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Yiran Chen

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Hai Helen Li

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