Jianlei Yang, Peiyuan Wang, Yaojun Zhang, Yuanqing Cheng, Weisheng Zhao, Yiran Chen, Hai Helen Li. Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(3):380-393, 2016. [doi]
@article{YangWZCZCL16,
title = {Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach},
author = {Jianlei Yang and Peiyuan Wang and Yaojun Zhang and Yuanqing Cheng and Weisheng Zhao and Yiran Chen and Hai Helen Li},
year = {2016},
doi = {10.1109/TCAD.2015.2474366},
url = {http://dx.doi.org/10.1109/TCAD.2015.2474366},
researchr = {https://researchr.org/publication/YangWZCZCL16},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {35},
number = {3},
pages = {380-393},
}