Jianlei Yang, Peiyuan Wang, Yaojun Zhang, Yuanqing Cheng, Weisheng Zhao, Yiran Chen, Hai Helen Li. Radiation-Induced Soft Error Analysis of STT-MRAM: A Device to Circuit Approach. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(3):380-393, 2016. [doi]
Abstract is missing.