Analyzing Internal-Switching Induced Simultaneous Switching Noise

Li Yang, J. S. Yuan. Analyzing Internal-Switching Induced Simultaneous Switching Noise. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 410, IEEE Computer Society, 2003. [doi]

Authors

Li Yang

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J. S. Yuan

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