Li Yang, J. S. Yuan. Analyzing Internal-Switching Induced Simultaneous Switching Noise. In 4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA. pages 410, IEEE Computer Society, 2003. [doi]
@inproceedings{YangY03:1,
title = {Analyzing Internal-Switching Induced Simultaneous Switching Noise},
author = {Li Yang and J. S. Yuan},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/isqed/2003/1881/00/18810410abs.htm},
researchr = {https://researchr.org/publication/YangY03%3A1},
cites = {0},
citedby = {0},
pages = {410},
booktitle = {4th International Symposium on Quality of Electronic Design (ISQED 2003), 24-26 March 2003, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1881-8},
}