Wen Yang, Jiann-shiun Yuan, Balakrishnan Krishnan, An-Jye Tzou, Wen-Kuan Yeh. Substrate Bias Effect on Dynamic Characteristics of a Monolithically Integrated GaN Half-Bridge. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.