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Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology

Kexin Yang, Rui Zhang, Taizhi Liu, Dae-Hyun Kim, Linda Milor. Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology. In Conference on Design of Circuits and Integrated Systems, DCIS 2018, Lyon, France, November 14-16, 2018. pages 1-6, IEEE, 2018. [doi]

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