The following publications are possibly variants of this publication:
- Statistical analysis of random telegraph noise in digital circuitsXiaoming Chen, Yu Wang, Yu Cao, Huazhong Yang. aspdac 2014: 161-166 [doi]
- OMI/TMI-based Modeling and Fast Simulation of Random Telegraph Noise (RTN) in Advanced Logic Devices and CircuitsRunsheng Wang, Zhe Zhang, Shaofeng Guo, Qingxue Wang, Dehuang Wu, Joddy Wang, Ru Huang. asicon 2019: 1-4 [doi]
- Evaluation and mitigation of performance degradation under random telegraph noise for digital circuitsXiaoming Chen, Hong Luo, Yu Wang 0002, Yu Cao, Yuan Xie, Yuchun Ma, Huazhong Yang. iet-cds, 7(5):273-282, 2013. [doi]