FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator - researchr publication authors

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Yuyang Ye, Zonghui Wang, Zun Xue, Ziqi Wang, Yifei Gao, Hao Yan. FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator. In Himanshu Thapliyal, Ronald F. DeMara, Inna Partin-Vaisband, Srinivas Katkoori, editors, Proceedings of the Great Lakes Symposium on VLSI 2023, GLSVLSI 2023, Knoxville, TN, USA, June 5-7, 2023. pages 299-304, ACM, 2023. [doi]

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