Yuyang Ye, Zonghui Wang, Zun Xue, Ziqi Wang, Yifei Gao, Hao Yan. FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator. In Himanshu Thapliyal, Ronald F. DeMara, Inna Partin-Vaisband, Srinivas Katkoori, editors, Proceedings of the Great Lakes Symposium on VLSI 2023, GLSVLSI 2023, Knoxville, TN, USA, June 5-7, 2023. pages 299-304, ACM, 2023. [doi]
@inproceedings{YeWXWGY23,
title = {FPGNN-ATPG: An Efficient Fault Parallel Automatic Test Pattern Generator},
author = {Yuyang Ye and Zonghui Wang and Zun Xue and Ziqi Wang and Yifei Gao and Hao Yan},
year = {2023},
doi = {10.1145/3583781.3590250},
url = {https://doi.org/10.1145/3583781.3590250},
researchr = {https://researchr.org/publication/YeWXWGY23},
cites = {0},
citedby = {0},
pages = {299-304},
booktitle = {Proceedings of the Great Lakes Symposium on VLSI 2023, GLSVLSI 2023, Knoxville, TN, USA, June 5-7, 2023},
editor = {Himanshu Thapliyal and Ronald F. DeMara and Inna Partin-Vaisband and Srinivas Katkoori},
publisher = {ACM},
}