Hybrid Built-In Self-Test Architecture for Multi-port Static RAMs - researchr publication authors

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Lizhen Yu, Jeffrey Hung, Boryau Sheu, Bill Huynh, Loc Nguyen, Shianling Wu, Laung-Terng Wang, Xiaoqing Wen. Hybrid Built-In Self-Test Architecture for Multi-port Static RAMs. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 331-339, IEEE Computer Society, 2010. [doi]

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