Lizhen Yu, Jeffrey Hung, Boryau Sheu, Bill Huynh, Loc Nguyen, Shianling Wu, Laung-Terng Wang, Xiaoqing Wen. Hybrid Built-In Self-Test Architecture for Multi-port Static RAMs. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 331-339, IEEE Computer Society, 2010. [doi]
@inproceedings{YuHSHNWWW10,
title = {Hybrid Built-In Self-Test Architecture for Multi-port Static RAMs},
author = {Lizhen Yu and Jeffrey Hung and Boryau Sheu and Bill Huynh and Loc Nguyen and Shianling Wu and Laung-Terng Wang and Xiaoqing Wen},
year = {2010},
doi = {10.1109/DFT.2010.47},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2010.47},
researchr = {https://researchr.org/publication/YuHSHNWWW10},
cites = {0},
citedby = {0},
pages = {331-339},
booktitle = {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-8447-8},
}